Electron Microscope Accessories
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Gilder F2 Finder Copper Grid
A thin film of pure carbon coats the shiny side of a Gilder Finder grid. Coated grids are optically checked and batch tested in the electron microscope. Packed in grid storage box. Standard thickness is 5-6 nm.
Grid: Copper
Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on Single 1000 µm hole Copper Grid
A thin film of pure formvar resin coats the shiny side of a single hole grid. Coated grids are optically checked and batch tested in the electron microscope. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Copper
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on London Finder LF200 Copper Grid
A thin film of pure carbon deposited on the shiny side of a London Finder grid. Coated grids are optically checked and batch tested in the electron microscope. Packed in grid storage box. Standard thickness is 5-6 nm.
Grid: Copper
Thickness: 5-6 nm
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface, 1/4" height, Aluminum
Hitachi M4 SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1-1/4
Pin height: 1/4"
Electron Microscopy Sciences SEM Hitachi S-450 M4 Mount 3-Division 5/8", 1/4" height, Aluminum
Hitachi S-450 SEM mounts with M4 tapered hole and female thread. With 3 divisions. Made from ultra-pure aluminum with standard lathe finish.
Head: 5/8"
Height: 1/4"
Electron Microscopy Sciences EMS Molybdenum Aperture with 20 µm hole, 6 mm O.D., 0.24 mm thick
O.D.: 6 mm
Thickness: 0.24 mm
Electron Microscopy Sciences Calibration Standard Model 70-1D with Cert Mounted on Pin St
A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For SEM, this specimen works well at a wide range of accelerating voltages (1 kV to 20 kV have been tested) and calibrates images from 25 kX to 1000 kX.
Electron Microscopy Sciences EMS Molybdenum Aperture with 150 µm hole, 6.35 mm O.D., 0.006 mm thick
Molybdenum disc aperture with 150 um hole for use with ETEC electron microscopes.
O.D.: 6.35 mm
Thickness: 0.006 mm
Electron Microscopy Sciences EMS Molybdenum Aperture with 50 µm hole, 6.35 mm O.D., 0.006 mm thick
Molybdenum disc aperture with50 um hole for use with ETEC electron microscopes.
O.D.: 6.35 mm
Thickness: 0.006 mm
Electron Microscopy Sciences Calibration Specimen 300-2D, SEM Pin
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: SEM Pin
Electron Microscopy Sciences Gilder Single Slot Oval Grid G102, Gold, 1000 x 200 µm Slot
Single Slot TEM Grids with oval holes have a thickness of are 50 microns. Each grid is individually inspected.
Material: Gold
Slot: 1000 x 200 µm
Electron Microscopy Sciences SEM Clip Specimen Block, 8 Clips
Engraved specimen block. Numbered. Measures 12 x 48 mm. Comes complete with pin. The 8 clip is numbered 1-8.
